Non-wovens & Textiles - Basis Weight Measurement | INDEV-ACT

Non-wovens & Textiles – Global Trendsetting Technology

  

Non-woven basis weight measurement

INDEV-ACT provides market stability and innovation with over 50 years of customer service delivering Industry Leading Technology, Cost Effectiveness, and Flexibility in the Non-wovens and Textiles Arena. INDEV-ACT is the world’s leading provider of systems control, process control and automation for control in the Non-wovens & Textiles market.

The range of INDEV-ACT products and services sets new standards in terms of quality assurance and process optimization, and its explicit objective is to ensure best possible value for the money, no matter how diverse the individual requirements are.

INDEV-ACT specializes in helping to ensure the consistent, uncompromising quality and ROI of all products you produce in a web process form; Non-wovens & Textiles, Coating/Converting, Extrusion, and Carpet.

Why do so many industry leaders worldwide rely on INDEV-ACT high performance systems to optimize their process and reduce cost to manufacture?

Because INDEV-ACT has been a dependable Gauging Supplier for over 50 years and many of our customers have systems operating for over 20 years. INDEV-ACT provides an effective upgrade path to keep your system operating with the latest EnvisionUltra and Sensor technologies.

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Fixed, Single Sided and Dual Sided and Scanning Platforms are available with multiple synchronized scanners measuring tandem coatings, basis weight moisture, thickness, color, incorporating lane control and pump control.

Supported Industry Processes

  • Air Laid/Dry Laid
  • Carded
  • Melt Blown
  • Needle Punch
  • Spun bond/SMS
  • Spunlace
  • Wetlaid
  • Hydroentangled
Providing Measurement and Control Technology for:

  • Thickness (Non-Contacting)
  • Density
  • Basis Weight
  • Mid-IR Moisture and Composite
  • Co-Extrusion
  • Lane Control
  • Porosity Mesurement
  • Process Control (Pump Control)
  • Multi-Composite Discrimination
  • Cascade MD Control
  • APC Control
  • SPOT-Track (Same spot control)
  • Color Interpretation
  • Data History
  • Process Analysis
  • Remote Connectability
  • Open Architecture